Optical Thin Film technologies, PerkinElmer instruments, 8D, problem-solving methodologies, thin film optical coating design and analysis software tools, Optilayer Essential, HunterLab spectrophotometers, X-Rite color measurement, thin film characterization techniques, Macleod, Lean Principles, Ellipsometer, TFCalc, vacuum coating sputtering process, profilometers, Six Sigma