wet strip, Vapor etch, particle counters, surface science, Spc, thickness measurement, selective chemical etching, rational risk assessment, analytic methods related to material properties, process technology development, fab metrology tools, memory process flow, electrical evaluation methods, Doe, data analysis systems, vertical NAND, dry strip

Ml, Data Science, Modeling, semiconductor materials interactions, surface science, wet process technology, process integration, semiconductor technology development, Ai