test program development , Correlation, test hardware development, Burn-In Boards, final test, Probe Cards, Advantest V93K, Failure Analysis, test data analytics, wafer sort, Silicon Characterization, Load Boards, ATE test development, yield improvement, shmoo analysis, statistical methods, Burn-In

Statistical Analysis, Data Analytics, Automation, Silicon Characterization, Production Release NPI, ATE platforms, Yield analysis and optimization, SoC Test Development, Engineering problem solving, SoC architectures, Wafer sort and final test development, Product Qualification, Test methodologies and qualification processes

Java, Perl, Python, MBIST, System Level Testing, AI architecture, Cadence EDA tools, DFT and ATE test methodologies, Functional High speed IO, ATPG, Scan, AMS pattern development and debug

electrical reliability testing, Failure Analysis, ISO 17025 standards, root cause investigation, Vibration, humidity, thermal cycling

System Architecture, Failure Analysis, test flows, device validation, data extraction and analysis, NAND design, AI workflow solutions

Failure Analysis, process integration, 3D NAND device physics, semiconductor manufacturing processes, electrical characterization, modeling and simulation