Promotion of Innovation, Basic device physics, Data Analysis, Statistics, DRAM architecture, Reliability Test Flow Development, Cross-Functional Collaboration, DPM reduction, Risk Management, Project Management, Reliability Test Plan and Execution, Root Cause and Resolution of Qual and RMA Device Issues, CMOS technology, Process Conversions and HVM, Mentorship and Development of Others, Technical Decision Making

Scripting, Statistics, Verilog simulations, Data analysis tools, Product Engineering, Electrical and Electronics Engineering, CAD Tools