X-ray Photoelectron Spectroscopy (XPS), Auger Electron Spectroscopy (AES), X-ray Diffraction (XRD), Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Vacuum coating sputtering process, Vacuum Coater Processes, Optical Thin Film technologies, Chemical and optical coatings durability testing, PerkinElmer instruments, Thin film optical coating design and analysis software, Thin film characterization techniques, Essential Macleod, HunterLab spectrophotometers, X-Rite color measurement, Ellipsometer, Lean Principles, TFCalc, Profilometers, Optilayer, Six Sigma